Benchmarking of Monolithic 3D Integrated MX2 FETs with Si FinFETs
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Author / Producer
Date
2017
Publication Type
Conference Paper
ETH Bibliography
yes
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Publication status
published
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Book title
2017 IEEE International Electron Devices Meeting (IEDM)
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Pages / Article No.
Publisher
IEEE
Event
2017 IEEE International Electron Devices Meeting (IEDM)