Determination of the Au/SiNx interfacial energy by AFM and FIB tomography
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Author / Producer
Date
2013-11-01
Publication Type
Journal Article
ETH Bibliography
yes
Citations
Altmetric
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Data
Rights / License
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Publication status
published
External links
Editor
Book title
Journal / series
Volume
617
Pages / Article No.
94 - 105
Publisher
Elsevier
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Atomic force microscopy (AFM); Dewetting; Focused ion-beam (FIB) tomography; Gold; Interfacial energy; Thin films
Organisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph