Gastmoleküle in ausgerichteten Zeolithen und Rasterkraftmikroskopie an Zeolithoberflächen
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Author / Producer
Date
1997
Publication Type
Doctoral Thesis
ETH Bibliography
yes
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published
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Contributors
Examiner : Gobrecht, Jens
Examiner : Prins, Roel
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Publisher
ETH Zürich
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Subject
RASTERKRAFTMIKROSKOPE, RKM + RASTERKRAFTMIKROSKOPIE; OBERFLÄCHENBESCHAFFENHEIT, MORPHOLOGIE, RAUHIGKEIT (PHYSIK VON MOLEKULARSYSTEMEN); ADSORPTION VON ATOMEN (SORPTION); MOLEKULARSIEBE + ZEOLITHE (CHEMISCHE ERZEUGNISSE); WAFER (MIKROELEKTRONIK); SILICIUM (CHEMISCHE ELEMENTE); EINKRISTALLE; ATOMIC FORCE MICROSCOPES, AFM + ATOMIC FORCE MICROSCOPY; SURFACE STRUCTURE, MORPHOLOGY, ROUGHNESS (PHYSICS OF MOLECULAR SYSTEMS); ADSORPTION OF ATOMS (SORPTION); MOLECULAR SIEVES + ZEOLITES (CHEMICAL PRODUCTS); WAFER (MICROELECTRONICS); SILICON (CHEMICAL ELEMENTS); SINGLE CRYSTALS
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Notes
Diss. Naturwiss. ETH Zürich, Nr. 11947, 1996. Ref.: R. Prins ; Korref.: J. Gobrecht.