Paving the way for ultimate device scaling through nanoelectronic device simulations
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Author / Producer
Date
2013
Publication Type
Conference Paper
ETH Bibliography
yes
Citations
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Rights / License
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Publication status
published
External links
Editor
Book title
14th International Conference on Ultimate Integration on Silicon (ULIS) 2013
Journal / series
Volume
Pages / Article No.
53 - 56
Publisher
IEEE
Event
14th International Conference on Ultimate Integration on Silicon (ULIS)
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Quantum transport; Full-band and atomistic simulations; Si nanowire field-effect transistors; Source-to-drain tunneling; Device scaling transport
Organisational unit
03925 - Luisier, Mathieu / Luisier, Mathieu