Tunable X-ray speckle-based phase-contrast and dark-field imaging using the unified modulated pattern analysis approach
OPEN ACCESS
Loading...
Author / Producer
Date
2018-05
Publication Type
Journal Article
ETH Bibliography
yes
Citations
Altmetric
OPEN ACCESS
Data
Rights / License
Abstract
X-ray phase-contrast and dark-field imaging provides valuable, complementary information about the specimen under study. Among the multimodal X-ray imaging methods, X-ray grating interferometry and speckle-based imaging have drawn particular attention, which, however, in their common implementations incur certain limitations that can restrict their range of applications. Recently, the unified modulated pattern analysis (UMPA) approach was proposed to overcome these limitations and combine grating- and speckle-based imaging in a single approach. Here, we demonstrate the multimodal imaging capabilities of UMPA and highlight its tunable character regarding spatial resolution, signal sensitivity and scan time by using different reconstruction parameters.
Permanent link
Publication status
published
Editor
Book title
Journal / series
Volume
13
Pages / Article No.
Publisher
IOP Publishing
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Inspection with x-rays; Multi-modality systems; X-ray radiography and digital radiography (DR); Computerized Tomography (CT) and Computed Radiography (CR)