Evaluation of Artifacts by EEG Electrodes During RF Exposures
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Author / Producer
Date
2009
Publication Type
Other Conference Item
ETH Bibliography
yes
Citations
Altmetric
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Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
Abstract collection, joint meeting of the Bioelectromagnetics Society and the European BioElectromagnetics Association 2009 : Davos, Switzerland, 14 - 19 June 2009
Journal / series
Volume
Pages / Article No.
61 - 62
Publisher
Curran
Event
Joint meeting of the Bioelectromagnetics Society and the European BioElectromagnetics Association 2009 (BioEM 2009)