Temperature Dependence of Annealed and Nonannealed HEMT Ohmic Contacts Between 5 and 350 K
METADATA ONLY
Loading...
Author / Producer
Date
2013-02
Publication Type
Journal Article
ETH Bibliography
yes
Citations
Altmetric
METADATA ONLY
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
Journal / series
IEEE Transactions on Electron Devices
Volume
60 (2)
Pages / Article No.
787 - 792
Publisher
IEEE
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
$R_{c}$ , $R_{g}$; Annealed; InP HEMT; Contact; Cryogenic; Gate; Nonannealed; Process metals; Resistance; Temperature dependence
Organisational unit
03721 - Bolognesi, Colombo / Bolognesi, Colombo
Notes
Published online 14 January 2013.