Effect of Surface Roughness and Phonon Scattering on Extremely Narrow InAs-Si Nanowire TFETs
METADATA ONLY
Loading...
Author / Producer
Date
2016
Publication Type
Conference Paper
ETH Bibliography
yes
Citations
Altmetric
METADATA ONLY
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
2016 46th European Solid-State Device Research Conference (ESSDERC)
Journal / series
Volume
Pages / Article No.
188 - 191
Publisher
IEEE
Event
46th European Solid-State Device Research Conference (ESSDERC)
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Organisational unit
03925 - Luisier, Mathieu / Luisier, Mathieu