Rapid qualitative phase analysis in highly textured thin films by x-ray diffraction
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Author / Producer
Date
2008
Publication Type
Journal Article
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yes
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published
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Volume
79 (4)
Pages / Article No.
Publisher
American Institute of Physics
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03692 - Spolenak, Ralph / Spolenak, Ralph
Notes
Received 4 February 2008, accepted 19 March 2008, published 17 April 2008.