Secure testing of VLSI cryptrographic equipment
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Author / Producer
Date
1993
Publication Type
Doctoral Thesis
ETH Bibliography
yes
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Publication status
published
External links
Editor
Contributors
Examiner : Fichtner, Wolfgang
Examiner : Massey, James
Book title
Journal / series
Volume
Pages / Article No.
Publisher
ETH Zürich
Event
Edition / version
Methods
Software
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Date collected
Date created
Subject
KRYPTOGRAPHIE (INFORMATIONSTHEORIE); HÖCHSTINTEGRIERTE SCHALTUNGEN, VLSI (MIKROELEKTRONIK); SELBSTTEST, BIST (MIKROELEKTRONIK); CRYPTOGRAPHY (INFORMATION THEORY); VERY LARGE SCALE INTEGRATED CIRCUITS, VLSI (MICROELECTRONICS); SELF-TEST + BUILT-IN-SELF-TEST, BIST (MICROELECTRONICS)
Organisational unit
Notes
Diss. Techn. Wiss. ETH Zürich, Nr. 10204, 1993. Ref.: W. Fichtner ; Korref.: J. L. Massey.