Thin film transistors with a ZnO channel and gate dielectric layers of HfO2 by atomic layer deposition


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Date

2010

Publication Type

Journal Article

ETH Bibliography

yes

Citations

Altmetric
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Data

Rights / License

Publication status

published

Editor

Book title

Volume

28 (6)

Pages / Article No.

1173

Publisher

American Institute of Physics

Event

Edition / version

Methods

Software

Geographic location

Date collected

Date created

Subject

Organisational unit

03609 - Hierold, Christofer / Hierold, Christofer check_circle

Notes

Published online 21 October 2010.

Funding

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