Scanning a metallic tip close to a quantum point contact
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Author / Producer
Date
2006-05
Publication Type
Conference Paper
ETH Bibliography
yes
Citations
Altmetric
METADATA ONLY
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
Journal / series
Volume
32 (1-2)
Pages / Article No.
167 - 170
Publisher
Elsevier
Event
12th International Conference on Modulated Semiconductor Structures (MSS12)
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Scanning probe microscopy; Scanning-gate microscopy; Quantum point contact
Organisational unit
03439 - Ensslin, Klaus / Ensslin, Klaus
03833 - Wegscheider, Werner / Wegscheider, Werner
08835 - Ihn, Thomas (Tit.-Prof.)
Notes
Available online 15 February 2006.