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dc.contributor.author
Huang, Pengcheng
dc.contributor.author
Kumar, Pratyush
dc.contributor.author
Giannopoulou, Georgia
dc.contributor.author
Thiele, Lothar
dc.date.accessioned
2017-06-11T18:52:30Z
dc.date.available
2017-06-11T18:52:30Z
dc.date.issued
2015
dc.identifier.isbn
978-3-9815-3704-8
dc.identifier.uri
http://hdl.handle.net/20.500.11850/103381
dc.language.iso
en
dc.publisher
IEEE
dc.title
Run and Be Safe: Mixed-Criticality Scheduling with Temporary Processor Speedup
dc.type
Conference Paper
ethz.book.title
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)
ethz.pages.start
1329
ethz.pages.end
1334
ethz.event
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)
ethz.event.location
Grenoble, France
ethz.event.date
March 9-13, 2015
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02640 - Inst. f. Technische Informatik und Komm. / Computer Eng. and Networks Lab.::03429 - Thiele, Lothar (emeritus) / Thiele, Lothar (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02640 - Inst. f. Technische Informatik und Komm. / Computer Eng. and Networks Lab.::03429 - Thiele, Lothar (emeritus) / Thiele, Lothar (emeritus)
ethz.relation.isNewVersionOf
handle/20.500.11850/94238
ethz.date.deposited
2017-06-11T18:53:26Z
ethz.source
ECIT
ethz.identifier.importid
imp59365366529c036551
ethz.ecitpid
pub:161625
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T15:41:24Z
ethz.rosetta.lastUpdated
2023-02-06T12:59:34Z
ethz.rosetta.versionExported
true
ethz.COinS
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