Digital alloy interface grading of an InAlAs/InGaAs quantum cascade laser structure studied by cross-sectional scanning tunneling microscopy
dc.contributor.author
Offermans, Peter
dc.contributor.author
Koenraad, Paul M.
dc.contributor.author
Wolter, Joachim H.
dc.contributor.author
Beck, Mattias
dc.contributor.author
Aellen, Thierry
dc.contributor.author
Faist, Jérôme
dc.date.accessioned
2017-06-12T04:39:40Z
dc.date.available
2017-06-12T04:39:40Z
dc.date.issued
2003-11
dc.identifier.issn
0003-6951
dc.identifier.issn
1077-3118
dc.identifier.other
10.1063/1.1627942
dc.identifier.uri
http://hdl.handle.net/20.500.11850/115435
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.title
Digital alloy interface grading of an InAlAs/InGaAs quantum cascade laser structure studied by cross-sectional scanning tunneling microscopy
dc.type
Journal Article
ethz.journal.title
Applied Physics Letters
ethz.journal.volume
83
ethz.journal.issue
20
ethz.journal.abbreviated
Appl. Phys. Lett.
ethz.pages.start
4131
ethz.pages.end
4133
ethz.identifier.nebis
000038985
ethz.publication.place
Melville, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
ethz.date.deposited
2017-06-12T04:46:10Z
ethz.source
ECIT
ethz.identifier.importid
imp593654534cdff64519
ethz.ecitpid
pub:177266
ethz.eth
no
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-20T16:03:58Z
ethz.rosetta.lastUpdated
2024-02-02T00:02:53Z
ethz.rosetta.versionExported
true
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Journal Article [128946]