Enabling Accurate and Practical Online Flash Channel Modeling for Modern MLC NAND Flash Memory
Metadata only
Datum
2016-09Typ
- Journal Article
ETH Bibliographie
yes
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Publikationsstatus
publishedExterne Links
Zeitschrift / Serie
IEEE Journal on Selected Areas in CommunicationsBand
Seiten / Artikelnummer
Verlag
IEEEThema
Fault tolerance; Flash memory; Memory reliability; Modeling; Solid state drives; Threshold voltage distributionOrganisationseinheit
09483 - Mutlu, Onur / Mutlu, Onur
ETH Bibliographie
yes
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