Modeling the Effect of Interface Roughness on the Performance of Tunnel FETs
Metadata only
Date
2017-02Type
- Journal Article
Publication status
publishedExternal links
Journal / series
IEEE Electron Device LettersVolume
Pages / Article No.
Publisher
IEEESubject
Tunnel transistors; Interface roughness; Field induced quantum confinementNotes
Published online 7 December 2016.More
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