In situ attenuated total reflection tribometry
A new approach for the chemical analysis of tribological films
dc.contributor.author
Piras, Federica Maria
dc.contributor.supervisor
Spencer, Nicholas D.
dc.date.accessioned
2017-06-13T03:53:33Z
dc.date.available
2017-06-13T03:53:33Z
dc.date.issued
2002
dc.identifier.uri
http://hdl.handle.net/20.500.11850/146793
dc.identifier.doi
10.3929/ethz-a-004409657
dc.format
application/pdf
dc.language.iso
en
dc.publisher
s.n.
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
REIBUNGSMESSUNG (MECHANIK)
dc.subject
SCHMIERUNG, TRIBOLOGIE
dc.subject
EIGENSCHAFTEN VON SCHMIERSTOFFEN (SCHMIERUNG)
dc.subject
MESSTECHNIK (PHYSIK)
dc.subject
INFRAROTSPEKTROSKOPIE
dc.subject
FRICTION MEASUREMENT (MECHANICS)
dc.subject
LUBRICATION, TRIBOLOGY
dc.subject
PROPERTIES OF LUBRICANTS (LUBRICATION)
dc.subject
MEASURING TECHNIQUES (PHYSICS)
dc.subject
INFRARED SPECTROSCOPY
dc.title
In situ attenuated total reflection tribometry
dc.type
Doctoral Thesis
dc.rights.license
In Copyright - Non-Commercial Use Permitted
ethz.title.subtitle
A new approach for the chemical analysis of tribological films
ethz.size
248 S.
ethz.code.ddc
DDC - DDC::6 - Technology, medicine and applied sciences::620 - Engineering & allied operations
ethz.notes
Diss., Naturwissenschaften ETH Zürich, Nr. 14638, 2002.
ethz.identifier.diss
14638
ethz.identifier.nebis
004409657
ethz.publication.place
Zürich
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02646 - Institut für Polymere / Institute of Polymers::03389 - Spencer, Nicholas (emeritus) / Spencer, Nicholas (emeritus)
ethz.date.deposited
2017-06-13T03:54:42Z
ethz.source
ECOL
ethz.identifier.importid
imp59366a5edfb3225082
ethz.ecolpid
eth:25760
ethz.eth
yes
ethz.availability
Open access
ethz.rosetta.installDate
2017-07-13T18:38:16Z
ethz.rosetta.lastUpdated
2023-02-06T13:48:32Z
ethz.rosetta.versionExported
true
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Doctoral Thesis [30094]