Charge writing with an atomic force microscope tip and electrostatic attachment of colloidal particles to the charge patterns
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Author
Date
2002Type
- Doctoral Thesis
ETH Bibliography
yes
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Permanent link
https://doi.org/10.3929/ethz-a-004494822Publication status
publishedExternal links
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Publisher
s.n.Subject
RASTERKRAFTMIKROSKOPE, RKM + RASTERKRAFTMIKROSKOPIE; MIKROSTRUKTUR VON MOLEKULARSYSTEMEN (PHYSIK); ERZEUGUNG DÜNNER SCHICHTEN (PHYSIK VON MOLEKULARSYSTEMEN); NANOSTRUKTUR (PHYSIK DER KONDENSIERTEN MATERIE); ATOMIC FORCE MICROSCOPES, AFM + ATOMIC FORCE MICROSCOPY; MICROSTRUCTURE OF MOLECULAR SYSTEMS (PHYSICS); PRODUCTION OF THIN FILMS (PHYSICS OF MOLECULAR SYSTEMS); NANOSTRUCTURE (CONDENSED MATTER PHYSICS)Organisational unit
03444 - Stemmer, Andreas / Stemmer, Andreas
Notes
Diss., Technische Wissenschaften ETH Zürich, Nr. 14854, 2002.More
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ETH Bibliography
yes
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