Microtensile testing of submicrometer thick functional polymer samples
dc.contributor.author
Lang, Udo
dc.contributor.author
Süss, Tobias
dc.contributor.author
Dual, Jürg
dc.date.accessioned
2017-06-10T08:08:30Z
dc.date.available
2017-06-10T08:08:30Z
dc.date.issued
2012-07
dc.identifier.issn
0034-6748
dc.identifier.issn
1089-7623
dc.identifier.other
10.1063/1.4732807
dc.identifier.uri
http://hdl.handle.net/20.500.11850/54612
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.title
Microtensile testing of submicrometer thick functional polymer samples
dc.type
Journal Article
ethz.journal.title
Review of Scientific Instruments
ethz.journal.volume
83
ethz.journal.issue
7
ethz.journal.abbreviated
Rev Sci Instrum
ethz.pages.start
075110
ethz.size
5 p.
ethz.notes
Received 7 February 2012, Accepted 15 June 2012, Published online 19 July 2012.
ethz.identifier.wos
ethz.identifier.nebis
000025185
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02618 - Institut für Mechanische Systeme / Institute of Mechanical Systems::03307 - Dual, Jürg (emeritus) / Dual, Jürg (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02618 - Institut für Mechanische Systeme / Institute of Mechanical Systems::03307 - Dual, Jürg (emeritus) / Dual, Jürg (emeritus)
ethz.date.deposited
2017-06-10T08:11:39Z
ethz.source
ECIT
ethz.identifier.importid
imp59364facb026999563
ethz.ecitpid
pub:88164
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T20:07:31Z
ethz.rosetta.lastUpdated
2024-02-01T19:11:50Z
ethz.rosetta.versionExported
true
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