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dc.contributor.author
Balta, Efe C.
dc.contributor.author
Pease, Michael
dc.contributor.author
Moyne, James
dc.contributor.author
Barton, Kira
dc.contributor.author
Tilbury, Dawn M.
dc.date.accessioned
2024-04-25T13:56:35Z
dc.date.available
2024-04-25T07:16:28Z
dc.date.available
2024-04-25T13:56:35Z
dc.date.issued
2024-04
dc.identifier.issn
1545-5955
dc.identifier.issn
1558-3783
dc.identifier.other
10.1109/TASE.2023.3243147
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/670283
dc.description.abstract
Smart manufacturing (SM) systems utilize run-time data to improve productivity via intelligent decision-making and analysis mechanisms on both machine and system levels. The increased adoption of cyber-physical systems in SM leads to the comprehensive framework of cyber-physical manufacturing systems (CPMS) where data-enabled decision-making mechanisms are coupled with cyber-physical resources on the plant floor. Due to their cyber-physical nature, CPMS are susceptible to cyber-attacks that may cause harm to the manufacturing system, products, or even the human workers involved in this context. Therefore, detecting cyber-attacks efficiently and timely is a crucial step toward implementing and securing high-performance CPMS in practice. This paper addresses two key challenges to CPMS cyber-attack detection. The first challenge is distinguishing expected anomalies in the system from cyber-attacks. The second challenge is the identification of cyber-attacks during the transient response of CPMS due to closed-loop controllers. Digital twin (DT) technology emerges as a promising solution for providing additional insights into the physical process (twin) by leveraging run-time data, models, and analytics. In this work, we propose a DT framework for detecting cyber-attacks in CPMS during controlled transient behavior as well as expected anomalies of the physical process. We present a DT framework and provide details on structuring the architecture to support cyber-attack detection. Additionally, we present an experimental case study on off-the-shelf 3D printers to detect cyber-attacks utilizing the proposed DT framework to illustrate the effectiveness of our proposed approach.Note to Practitioners - This work is motivated by developing a general-purpose and extensible digital twin-enabled cyber-attack detection framework for manufacturing systems. Existing works in the field consider specialized attack scenarios and models that may not be extensible in practical manufacturing scenarios. We utilize digital twin (DT) technology as a key enabler to develop a systematic and extensible framework where we identify the abnormality of a resource and detect if the abnormality is due to an attack or an expected anomaly. We provide several remarks on how our proposed framework can extend existing industrial control systems (ICS) and can accommodate further extensions. The presented DTs utilize data-driven machine learning models, physics-based models, and subject matter expert knowledge to perform detection and differentiation tasks in the context of expected anomalies and model-based controllers that control the manufacturing process between multiple setpoints. We utilize a model predictive controller on an off-the-shelf 3D printer to run the process, and stage anomalies and cyber-attacks that are successfully detected by the proposed framework.
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.subject
Anomaly detection
en_US
dc.subject
control systems
en_US
dc.subject
cyberattack
en_US
dc.subject
cyber-physical systems
en_US
dc.subject
data analysis
en_US
dc.subject
digital twins
en_US
dc.subject
fault detection
en_US
dc.subject
intelligent automation
en_US
dc.subject
manufacturing automation
en_US
dc.subject
model checking
en_US
dc.subject
security
en_US
dc.title
Digital Twin-Based Cyber-Attack Detection Framework for Cyber-Physical Manufacturing Systems
en_US
dc.type
Journal Article
dc.date.published
2023-02-22
ethz.journal.title
IEEE Transactions on Automation Science and Engineering
ethz.journal.volume
21
en_US
ethz.journal.issue
2
en_US
ethz.journal.abbreviated
IEEE trans. autom. sci. eng.
ethz.pages.start
1695
en_US
ethz.pages.end
1712
en_US
ethz.identifier.scopus
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02650 - Institut für Automatik / Automatic Control Laboratory
en_US
ethz.date.deposited
2024-04-25T07:16:30Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2024-04-25T13:56:36Z
ethz.rosetta.lastUpdated
2024-04-25T13:56:36Z
ethz.rosetta.versionExported
true
ethz.COinS
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