Metadata only
Datum
2014Typ
- Journal Article
ETH Bibliographie
yes
Altmetrics
Publikationsstatus
publishedExterne Links
Zeitschrift / Serie
Annual Review of Statistics and Its ApplicationBand
Seiten / Artikelnummer
Verlag
Annual ReviewsThema
Causal inference; Graphical modeling; Multiple testing; Penalized estimation; RegressionOrganisationseinheit
03717 - van de Geer, Sara (emeritus) / van de Geer, Sara (emeritus)
03502 - Bühlmann, Peter L. / Bühlmann, Peter L.
ETH Bibliographie
yes
Altmetrics