Accuracy of Microwave Transistor f(T) and f(MAX) Extractions
dc.contributor.author
Teppati, Valeria
dc.contributor.author
Tirelli, Stefano
dc.contributor.author
Lövblom, Rickard
dc.contributor.author
Flückiger, Ralf
dc.contributor.author
Alexandrova, Maria
dc.contributor.author
Bolognesi, Colombo R.
dc.date.accessioned
2017-06-11T07:06:12Z
dc.date.available
2017-06-11T07:06:12Z
dc.date.issued
2014-04
dc.identifier.issn
0018-9383
dc.identifier.issn
1557-9646
dc.identifier.other
10.1109/TED.2014.2306573
dc.identifier.uri
http://hdl.handle.net/20.500.11850/82672
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Integrated circuit measurements
dc.subject
measurement uncertainty
dc.subject
millimeter wave devices
dc.subject
millimeter wave technology
dc.subject
millimeter wave transistors
dc.title
Accuracy of Microwave Transistor f(T) and f(MAX) Extractions
dc.type
Journal Article
ethz.journal.title
IEEE Transactions on Electron Devices
ethz.journal.volume
61
ethz.journal.issue
4
ethz.journal.abbreviated
IEEE Trans. Electron Devices
ethz.pages.start
984
ethz.pages.end
990
ethz.identifier.wos
ethz.identifier.nebis
000034955
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03721 - Bolognesi, Colombo / Bolognesi, Colombo
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03721 - Bolognesi, Colombo / Bolognesi, Colombo
ethz.date.deposited
2017-06-11T07:06:18Z
ethz.source
ECIT
ethz.identifier.importid
imp593651c9a7ff198940
ethz.ecitpid
pub:130419
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-18T09:37:10Z
ethz.rosetta.lastUpdated
2024-02-01T21:42:50Z
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true
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Journal Article [128741]