Yell
A computer program for diffuse scattering analysis via three-dimensional delta pair distribution function refinement
dc.contributor.author
Simonov, Arkadiy
dc.contributor.author
Weber, Thomas
dc.contributor.author
Steurer, Walter
dc.date.accessioned
2017-06-11T09:35:43Z
dc.date.available
2017-06-11T09:35:43Z
dc.date.issued
2014-06
dc.identifier.issn
0021-8898
dc.identifier.issn
1600-5767
dc.identifier.other
10.1107/S1600576714008668
dc.identifier.uri
http://hdl.handle.net/20.500.11850/85247
dc.language.iso
en
dc.publisher
Wiley-Blackwell
dc.subject
Computer programs
dc.subject
Diffuse scattering
dc.subject
Disorder
dc.subject
Pair distribution function
dc.title
Yell
dc.type
Journal Article
ethz.title.subtitle
A computer program for diffuse scattering analysis via three-dimensional delta pair distribution function refinement
ethz.journal.title
Journal of Applied Crystallography
ethz.journal.volume
47
ethz.journal.issue
3
ethz.journal.abbreviated
J. appl. crystallogr.
ethz.pages.start
1146
ethz.pages.end
1152
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Oxford
ethz.publication.status
published
ethz.leitzahl
03401 - Steurer, Walter
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::09778 - Simonov, Arkadiy / Simonov, Arkadiy
ethz.leitzahl.certified
03401 - Steurer, Walter
ethz.date.deposited
2017-06-11T09:39:24Z
ethz.source
ECIT
ethz.identifier.importid
imp593651fcc3d8734538
ethz.ecitpid
pub:134357
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T08:53:40Z
ethz.rosetta.lastUpdated
2024-02-01T21:54:25Z
ethz.rosetta.versionExported
true
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Publikationstyp
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Journal Article [130627]