Neural interface and atomic-force microscope in CMOS technology

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Author
Hafizović, Sadik
Date
2006
Type
    Doctoral Thesis
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-a-005352865
Publication status
published
External links
Search print copy at ETH Library
Contributors
Examiner: Hierlemann, Andreas
Examiner: Seung, Sebastian
Publisher
Physical Electronics Laboratory, ETH Zürich
Subject
KOMPLEMENTÄRE METALLOXID-HALBLEITERSCHALTUNGEN, CMOS (MIKROELEKTRONIK); MIKROSYSTEMTECHNIK, MST; RASTERKRAFTMIKROSKOPE, RKM + RASTERKRAFTMIKROSKOPIE; COMPLEMENTARY-METAL-OXIDE-SEMICONDUCTOR CIRCUITS, CMOS (MICROELECTRONICS); MICRO SYSTEM TECHNOLOGIES, MST; ATOMIC FORCE MICROSCOPES, AFM + ATOMIC FORCE MICROSCOPY
Organisational unit
03684 - Hierlemann, Andreas / Hierlemann, Andreas  
Notes
Diss., Eidgenössische Technische Hochschule ETH Zürich, Nr. 16806, 2006.
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