Neural interface and atomic-force microscope in CMOS technology
Author / Producer
Date
2006
Publication Type
Doctoral Thesis
ETH Bibliography
yes
Citations
Altmetric
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Contributors
Examiner : Hierlemann, Andreas
Examiner : Seung, Sebastian
Book title
Journal / series
Volume
Pages / Article No.
Publisher
Physical Electronics Laboratory, ETH Zürich
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
KOMPLEMENTÄRE METALLOXID-HALBLEITERSCHALTUNGEN, CMOS (MIKROELEKTRONIK); MIKROSYSTEMTECHNIK, MST; RASTERKRAFTMIKROSKOPE, RKM + RASTERKRAFTMIKROSKOPIE; COMPLEMENTARY-METAL-OXIDE-SEMICONDUCTOR CIRCUITS, CMOS (MICROELECTRONICS); MICRO SYSTEM TECHNOLOGIES, MST; ATOMIC FORCE MICROSCOPES, AFM + ATOMIC FORCE MICROSCOPY
Organisational unit
03684 - Hierlemann, Andreas / Hierlemann, Andreas
Notes
Diss., Eidgenössische Technische Hochschule ETH Zürich, Nr. 16806, 2006.