Noise-Induced Spectral Shift Measured in a Double Quantum Dot
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2009
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Journal Article
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Abstract
We measure the shot noise of a quantum point-contact using a capacitively coupled InAs double quantum dot as an on-chip sensor. Our measurement signals are the (bidirectional) interdot electronic tunneling rates which are determined by means of time-resolved charge sensing. The detector frequency is set by the relative detuning of the energy levels in the two dots. For nonzero detuning, the noise in the quantum point contact generates inelastic tunneling in the double dot and thus causes an increase in the interdot tunneling rate. Conservation of spectral weight in the dots implies that this increase must be compensated by a decrease in the rate close to zero detuning, which is quantitatively confirmed in our experiment. © 2009 The American Physical Society.
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published
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80 (11)
Pages / Article No.
115315
Publisher
American Physical Society
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03369 - Blatter, Johann W. (emeritus) / Blatter, Johann W. (emeritus)
03439 - Ensslin, Klaus / Ensslin, Klaus
08835 - Ihn, Thomas (Tit.-Prof.)
Notes
Received 23 April 2009, Revised 13 August 2009, Published 15 September 2009.