Precision thickness and refractive index imaging of molecular films
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Date
2007
Publication Type
Journal Article
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yes
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Abstract
We present an interferometric contrasting technique that allows visualizing the thickness and refractive index of a molecular film being part of an optical multilayer structure (etalon). Small wavelength shifts of the comblike etalon spectrum are transformed into measurable intensity variations using a second reference etalon (optical correlator), illuminated in series. A charge-coupled device camera acting as two-dimensional photometer is utilized to measure the optical spectral correlation (OSC) image. The performance of the here proposed optical spectral correlation method is demonstrated using very thin confined liquid films. We give a detailed signal-to-noise analysis. Subangstrom film thickness resolution is experimentally verified with single exposure images acquired at frame rates comparable to video standards (∼25Hz). Finally, we describe the calibration procedures necessary to obtain an absolute quantification of the OSC image.
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published
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Volume
78 (9)
Pages / Article No.
093105
Publisher
American Institute of Physics
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Subject
Fabry-Perot interferometers; liquid films; optical correlation; optical multilayers; refractive index
Organisational unit
03389 - Spencer, Nicholas (emeritus) / Spencer, Nicholas (emeritus)
Notes
Received 5 May 2007, Accepted 6 August 2007, Published 20 September 2007.