Unraveling thickness-dependent structural properties of CrSBr nanoflakes using hyperspectral TERS imaging
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Date
2025-12
Publication Type
Journal Article
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yes
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Abstract
CrSBr, a layered van der Waals material with intrinsic air stability and layer-dependent magnetic and electronic properties, has emerged as a promising 2D semiconductor. However, nanoscale insight into its thickness-dependent structural and electronic behavior remains limited. In this study, we employ hyperspectral tip-enhanced Raman spectroscopy (TERS) imaging to investigate the vibrational and electronic properties of exfoliated CrSBr nanoflakes. Both confocal Raman and TERS measurements reveal a systematic enhancement of the A²g Raman mode relative to the A³g mode in thinner flakes. The I (A²g)/I (A³g) intensity ratio decreases consistently with increasing flake thickness, reflecting underlying changes in the electronic band structure. Hyperspectral TERS mapping confirms this trend at the single-flake level and suggests a resonance Raman enhancement influenced by electronphonon coupling near the band edge. Our results establish the I (A²g)/I (A³g) ratio as a sensitive spectroscopic marker for thickness-dependent band structure evolution in CrSBr. More broadly, this work highlights hyperspectral TERS as a powerful tool for probing local structureproperty relationships in emerging low-dimensional materials.
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published
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Journal / series
Volume
595
Pages / Article No.
132349
Publisher
Elsevier
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Subject
Tip-enhanced Raman spectroscopy; Hyperspectral imaging; CrSBr nanoflakes; Two-dimensional semiconductor; Energy band structure