Scanning thermal microscopy of silicon nanostructures
dc.contributor.author
Menges, Fabian
dc.contributor.author
Stemmer, Andreas
dc.contributor.author
Riel, Heike
dc.contributor.author
Lantz, Mark A.
dc.contributor.author
Gotsmann, Bernd
dc.date.accessioned
2017-06-10T18:01:39Z
dc.date.available
2017-06-10T18:01:39Z
dc.date.issued
2010
dc.identifier.uri
http://hdl.handle.net/20.500.11850/68019
dc.language.iso
en
dc.publisher
Seeing at the Nanoscale VIII
dc.title
Scanning thermal microscopy of silicon nanostructures
dc.type
Other Conference Item
ethz.event
Seeing at the Nanoscale VIII
ethz.event.location
Basel, Switzerland
ethz.event.date
August 30 - September 1, 2010
ethz.notes
Conference lecture.
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.date.deposited
2017-06-10T18:04:23Z
ethz.source
ECIT
ethz.identifier.importid
imp593650b074a7a56980
ethz.ecitpid
pub:108103
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-08-01T16:46:39Z
ethz.rosetta.lastUpdated
2018-11-02T09:53:30Z
ethz.rosetta.versionExported
true
ethz.COinS
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Other Conference Item [19007]