Rapid qualitative phase analysis in highly textured thin films by x-ray diffraction
- Journal Article
Journal / seriesReview of Scientific Instruments
Pages / Article No.
PublisherAmerican Institute of Physics
Organisational unit03692 - Spolenak, Ralph / Spolenak, Ralph
NotesReceived 4 February 2008, accepted 19 March 2008, published 17 April 2008.
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