Rapid qualitative phase analysis in highly textured thin films by x-ray diffraction
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Date
2008Type
- Journal Article
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
Review of Scientific InstrumentsVolume
Pages / Article No.
Publisher
American Institute of PhysicsOrganisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph
Notes
Received 4 February 2008, accepted 19 March 2008, published 17 April 2008.More
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ETH Bibliography
yes
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