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dc.contributor.author
Ullah, Faheem
dc.contributor.author
Gross, Thomas
dc.contributor.editor
Jannesari, Ali
dc.contributor.editor
Benkner, Siegfried
dc.contributor.editor
Zhao, Xinghui
dc.contributor.editor
Atoofian, Ehsan
dc.contributor.editor
Sato, Yukionri
dc.date.accessioned
2017-06-12T05:29:08Z
dc.date.available
2017-06-12T05:29:08Z
dc.date.issued
2015
dc.identifier.isbn
978-1-4503-3910-0
dc.identifier.other
10.1145/2837476.2837478
dc.identifier.uri
http://hdl.handle.net/20.500.11850/116060
dc.language.iso
en
dc.publisher
Association for Computing Machinery
dc.subject
Dynamic binary instrumentation
dc.subject
Localisation
dc.subject
Measurement
dc.subject
Parallel programming
dc.subject
Performance bugs
dc.subject
Profiling
dc.subject
Software defects
dc.title
Profiling for detecting performance anomalies in concurrent software
dc.type
Conference Paper
ethz.book.title
Proceedings of the 2nd International Workshop on Software Engineering for Parallel Systems (SEPS 2015)
ethz.pages.start
11
ethz.pages.end
20
ethz.event
2nd International Workshop on Software Engineering for Parallel Systems, SEPS 2015
ethz.event.location
Pittsburgh, PA, USA
ethz.event.date
October 23-30, 2015
ethz.identifier.scopus
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::03422 - Gross, Thomas (emeritus) / Gross, Thomas (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::03422 - Gross, Thomas (emeritus) / Gross, Thomas (emeritus)
ethz.date.deposited
2017-06-12T05:34:08Z
ethz.source
ECIT
ethz.identifier.importid
imp5936545f3947b65033
ethz.ecitpid
pub:177913
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T15:19:35Z
ethz.rosetta.lastUpdated
2024-02-02T00:06:09Z
ethz.rosetta.versionExported
true
ethz.COinS
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