Charge Trapping Defects in CdSe Nanocrystal Quantum Dots
dc.contributor.author
Almeida, António J.
dc.contributor.author
Sahu, Ayaskanta
dc.contributor.author
Riedinger, Andreas
dc.contributor.author
Norris, David J.
dc.contributor.author
Brandt, Martin S.
dc.contributor.author
Stutzmann, Martin
dc.contributor.author
Pereira, Rui N.
dc.date.accessioned
2017-06-12T08:38:57Z
dc.date.available
2017-06-12T08:38:57Z
dc.date.issued
2016-06
dc.identifier.issn
1932-7455
dc.identifier.issn
1932-7447
dc.identifier.other
10.1021/acs.jpcc.6b00910
dc.identifier.uri
http://hdl.handle.net/20.500.11850/118107
dc.language.iso
en
dc.publisher
American Chemical Society
dc.title
Charge Trapping Defects in CdSe Nanocrystal Quantum Dots
dc.type
Journal Article
ethz.journal.title
The Journal of Physical Chemistry C
ethz.journal.volume
120
ethz.journal.issue
25
ethz.journal.abbreviated
J. Phys. Chem. C
ethz.pages.start
13763
ethz.pages.end
13770
ethz.notes
Published online 1 June 2016.
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
005283485
ethz.publication.place
Washington, DC
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02668 - Inst. f. Energie- und Verfahrenstechnik / Inst. Energy and Process Engineering::03875 - Norris, David J. / Norris, David J.
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02668 - Inst. f. Energie- und Verfahrenstechnik / Inst. Energy and Process Engineering::03875 - Norris, David J. / Norris, David J.
ethz.date.deposited
2017-06-12T08:39:16Z
ethz.source
ECIT
ethz.identifier.importid
imp5936548662bd114257
ethz.ecitpid
pub:180048
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T17:13:02Z
ethz.rosetta.lastUpdated
2023-02-06T13:26:21Z
ethz.rosetta.versionExported
true
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