Accurate Transient Calorimetric Measurement of Soft-Switching Losses of 10kV SiC MOSFETs
dc.contributor.author
Rothmund, Daniel
dc.contributor.author
Bortis, Dominik
dc.contributor.author
Kolar, Johann W.
dc.date.accessioned
2017-06-12T12:54:18Z
dc.date.available
2017-06-12T12:54:18Z
dc.date.issued
2016
dc.identifier.isbn
978-1-4673-8617-3
dc.identifier.isbn
978-1-4673-8618-0
dc.identifier.isbn
978-1-4673-8616-6
dc.identifier.other
10.1109/PEDG.2016.7527030
dc.identifier.uri
http://hdl.handle.net/20.500.11850/120764
dc.language.iso
en
dc.publisher
IEEE
dc.title
Accurate Transient Calorimetric Measurement of Soft-Switching Losses of 10kV SiC MOSFETs
dc.type
Conference Paper
ethz.book.title
2016 IEEE 7th International Symposium on Power Electronics for Distributed Generation Systems (PEDG)
ethz.pages.start
7527030
ethz.size
10 p.
ethz.event
7th International Symposium on Power Electronics for Distributed Generation Systems (PEDG 2016)
ethz.event.location
Vancouver, Canada
ethz.event.date
June 27-30, 2016
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. (emeritus) / Kolar, Johann W. (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. (emeritus) / Kolar, Johann W. (emeritus)
ethz.date.deposited
2017-06-12T12:55:11Z
ethz.source
ECIT
ethz.identifier.importid
imp593654b9eef4e24498
ethz.ecitpid
pub:182842
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T18:10:17Z
ethz.rosetta.lastUpdated
2023-02-06T13:30:37Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
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