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dc.contributor.author
Stupar, A.
dc.contributor.author
Bortis, Dominik
dc.contributor.author
Drofenik, U.
dc.contributor.author
Kolar, Johann W.
dc.date.accessioned
2017-06-14T15:06:44Z
dc.date.available
2017-06-14T15:06:44Z
dc.date.issued
2010
dc.identifier.isbn
978-1-4244-5394-8
dc.identifier.other
10.1109/IPEC.2010.5542179
dc.identifier.uri
http://hdl.handle.net/20.500.11850/158587
dc.language.iso
en
dc.publisher
IEEE
dc.subject
power cycling tests
dc.subject
reliability
dc.subject
test system
dc.title
Advanced setup for thermal cycling of power modules following definable junction temperature profiles
dc.type
Conference Paper
ethz.book.title
International Power Electronics Conference (IPEC), 2010
ethz.pages.start
962
ethz.pages.end
969
ethz.event
2010 International Power Electronics Conference (IPEC 2010)
ethz.event.location
Sapporo, Japan
ethz.event.date
June 21-24, 2010
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. (emeritus) / Kolar, Johann W. (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. (emeritus) / Kolar, Johann W. (emeritus)
ethz.date.deposited
2017-06-14T15:11:58Z
ethz.source
ECIT
ethz.identifier.importid
imp59364d4bd525036642
ethz.ecitpid
pub:42576
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T20:16:02Z
ethz.rosetta.lastUpdated
2023-02-06T14:04:59Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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