Design of optimum electron beam irradiation processes for the reliability of electric cables used in critical applications

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Author

Date

2011

Type

Journal Article

ETH Bibliography

yes

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Publication status

published

External links

Journal / series

Microelectronics Reliability

Volume

51(9-11)

Pages / Article No.

1479 - 1483

Publisher

Elsevier

Notes

Received 07 June 2011, Revised 30 June 2011, Accepted 01 July 2011, Available online 05 August 2011.

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ETH Bibliography

yes

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