Evidence of nonplanar field emission via secondary electron detection in near field emission scanning electron microscopy
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Date
2009Type
- Journal Article
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
Applied Physics LettersVolume
Pages / Article No.
Publisher
American Institute of PhysicsSubject
field emission; field emission electron microscopy; scanning electron microscopyNotes
Received 10 December 2008, Accepted 10 March 2009, Published online 14 April 2009.More
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ETH Bibliography
yes
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