Evidence of nonplanar field emission via secondary electron detection in near field emission scanning electron microscopy
Kirk, T. L.
De Pietro, L.G.
- Journal Article
Journal / seriesApplied Physics Letters
PublisherAmerican Institute of Physics
Subjectfield emission; field emission electron microscopy; scanning electron microscopy
NotesReceived 10 December 2008, Accepted 10 March 2009, Published online 14 April 2009.
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