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TuRaN: True Random Number Generation Using Supply Voltage Underscaling in SRAMs
(2022)arXivPrior works propose SRAM-based TRNGs that extract entropy from SRAM arrays. SRAM arrays are widely used in a majority of specialized or general-purpose chips that perform the computation to store data inside the chip. Thus, SRAM-based TRNGs present a low-cost alternative to dedicated hardware TRNGs. However, existing SRAM-based TRNGs suffer from 1) low TRNG throughput, 2) high energy consumption, 3) high TRNG latency, and 4) the inability ...Working Paper -
A Case for Self-Managing DRAM Chips: Improving Performance, Efficiency, Reliability, and Security via Autonomous in-DRAM Maintenance Operations
(2022)arXivThe memory controller is in charge of managing DRAM maintenance operations (e.g., refresh, RowHammer protection, memory scrubbing) in current DRAM chips. Implementing new maintenance operations often necessitates modifications in the DRAM interface, memory controller, and potentially other system components. Such modifications are only possible with a new DRAM standard, which takes a long time to develop, leading to slow progress in DRAM ...Working Paper -
Sectored DRAM: An Energy-Efficient High-Throughput and Practical Fine-Grained DRAM Architecture
(2022)arXivThere are two major sources of inefficiency in computing systems that use modern DRAM devices as main memory. First, due to coarse-grained data transfers (size of a cache block, usually 64B between the DRAM and the memory controller, systems waste energy on transferring data that is not used. Second, due to coarse-grained DRAM row activation, systems waste energy by activating DRAM cells that are unused in many workloads where spatial ...Working Paper -
DRAM Bender: An Extensible and Versatile FPGA-based Infrastructure to Easily Test State-of-the-art DRAM Chips
(2022)arXivTo understand and improve DRAM performance, reliability, security and energy efficiency, prior works study characteristics of commodity DRAM chips. Unfortunately, state-of-the-art open source infrastructures capable of conducting such studies are obsolete, poorly supported, or difficult to use, or their inflexibility limit the types of studies they can conduct. We propose DRAM Bender, a new FPGA-based infrastructure that enables experimental ...Working Paper -
SpyHammer: Using RowHammer to Remotely Spy on Temperature
(2022)arXivRowHammer is a DRAM vulnerability that can cause bit errors in a victim DRAM row by just accessing its neighboring DRAM rows at a high-enough rate. Recent studies demonstrate that new DRAM devices are becoming increasingly more vulnerable to RowHammer, and many works demonstrate system-level attacks for privilege escalation or information leakage. In this work, we leverage two key observations about RowHammer characteristics to spy on ...Working Paper -
A Case for Transparent Reliability in DRAM Systems
(2022)arXivToday's systems have diverse needs that are difficult to address using one-size-fits-all commodity DRAM. Unfortunately, although system designers can theoretically adapt commodity DRAM chips to meet their particular design goals (e.g., by reducing access timings to improve performance, implementing system-level RowHammer mitigations), we observe that designers today lack sufficient insight into commodity DRAM chips' reliability characteristics ...Working Paper -
Fundamentally Understanding and Solving RowHammer
(2022)arXivWe provide an overview of recent developments and future directions in the RowHammer vulnerability that plagues modern DRAM (Dynamic Random Memory Access) chips, which are used in almost all computing systems as main memory. RowHammer is the phenomenon in which repeatedly accessing a row in a real DRAM chip causes bitflips (i.e., data corruption) in physically nearby rows. This phenomenon leads to a serious and widespread system security ...Working Paper