Show simple item record

dc.contributor.author
Wang, Zhe
dc.contributor.author
Wang, Limin
dc.contributor.author
Wang, Yali
dc.contributor.author
Zhang, Bowen
dc.contributor.author
Qiao, Yu
dc.date.accessioned
2018-03-05T12:18:07Z
dc.date.available
2018-01-24T10:34:48Z
dc.date.available
2017-06-12T21:00:00Z
dc.date.available
2018-03-05T12:18:07Z
dc.date.issued
2017-04
dc.identifier.issn
1057-7149
dc.identifier.issn
1941-0042
dc.identifier.other
10.1109/tip.2017.2666739
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/246008
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.subject
Image representation
en_US
dc.subject
Scene recognition
en_US
dc.subject
PatchNet
en_US
dc.subject
VSAD
en_US
dc.subject
Semantic Codebook
en_US
dc.title
Weakly Supervised PatchNets: Describing and Aggregating Local Patches for Scene Recognition
en_US
dc.type
Journal Article
dc.date.published
2017-02-09
ethz.journal.title
IEEE Transactions on Image Processing
ethz.journal.volume
26
en_US
ethz.journal.issue
4
en_US
ethz.journal.abbreviated
IEEE Trans. Image Process.
ethz.pages.start
2028
en_US
ethz.pages.end
2041
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
010842782
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02652 - Institut für Bildverarbeitung / Computer Vision Laboratory
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02652 - Institut für Bildverarbeitung / Computer Vision Laboratory::03514 - Van Gool, Luc / Van Gool, Luc
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02652 - Institut für Bildverarbeitung / Computer Vision Laboratory::03514 - Van Gool, Luc / Van Gool, Luc
ethz.date.deposited
2017-06-12T21:01:11Z
ethz.source
FORM
ethz.source
ECIT
ethz.identifier.importid
imp5936556da3d7f36604
ethz.ecitpid
pub:193742
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-03-05T12:13:52Z
ethz.rosetta.lastUpdated
2023-02-06T15:15:00Z
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/233533
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/130716
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Weakly%20Supervised%20PatchNets:%20Describing%20and%20Aggregating%20Local%20Patches%20for%20Scene%20Recognition&rft.jtitle=IEEE%20Transactions%20on%20Image%20Processing&rft.date=2017-04&rft.volume=26&rft.issue=4&rft.spage=2028&rft.epage=2041&rft.issn=1057-7149&1941-0042&rft.au=Wang,%20Zhe&Wang,%20Limin&Wang,%20Yali&Zhang,%20Bowen&Qiao,%20Yu&rft.genre=article&rft_id=info:doi/10.1109/tip.2017.2666739&
 Search print copy at ETH Library

Files in this item

FilesSizeFormatOpen in viewer

There are no files associated with this item.

Publication type

Show simple item record