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dc.contributor.author
Christen, Daniel
dc.contributor.author
Biela, Jürgen
dc.date.accessioned
2022-11-23T13:56:04Z
dc.date.available
2018-07-06T16:07:02Z
dc.date.available
2018-07-09T10:20:35Z
dc.date.available
2018-09-27T10:00:41Z
dc.date.available
2018-11-06T15:36:55Z
dc.date.available
2018-12-20T17:43:51Z
dc.date.available
2019-03-12T14:50:00Z
dc.date.available
2022-11-23T13:15:18Z
dc.date.available
2022-11-23T13:56:04Z
dc.date.issued
2019-04
dc.identifier.issn
0885-8993
dc.identifier.issn
1941-0107
dc.identifier.other
10.1109/TPEL.2018.2851068
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/274385
dc.identifier.doi
10.3929/ethz-b-000274385
dc.description.abstract
Modern wide-bandgap devices, such as SiC- or GaN-based devices, feature significantly reduced switching losses, and the question arises if soft-switching operating modes are still beneficial. For most of the semiconductor devices, only limited information is available to estimate the switching losses. Especially, if a wide operating range is desired, excessive measurements have to be performed to determine the switching losses for arbitrary operating points. Therefore, in this paper, a fast calculation method to determine the switching losses based on the charge equivalent approximation of the MOSFET capacitances, relying only on datasheet parameters, is presented. In addition, the turn-OFF losses at high switching currents are investigated, and an analytical expression to estimate the maximum current range for which the MOSFET can be turned off with negligible switching losses is proposed.
en_US
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
Power MOSFET
en_US
dc.subject
switching losses
en_US
dc.subject
half-bridge
en_US
dc.title
Analytical Switching Loss Modelling based on Datasheet Parameters for MOSFETs in a Half-Bridge
en_US
dc.type
Journal Article
dc.rights.license
In Copyright - Non-Commercial Use Permitted
dc.date.published
2018-06-27
ethz.journal.title
IEEE Transactions on Power Electronics
ethz.journal.volume
34
en_US
ethz.journal.issue
4
en_US
ethz.journal.abbreviated
IEEE trans. power electron.
ethz.pages.start
3700
en_US
ethz.pages.end
3710
en_US
ethz.version.deposit
acceptedVersion
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
New York, NY
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03889 - Biela, Jürgen / Biela, Jürgen
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03889 - Biela, Jürgen / Biela, Jürgen
ethz.date.deposited
2018-07-06T16:07:05Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2019-03-12T14:50:23Z
ethz.rosetta.lastUpdated
2023-02-07T08:01:54Z
ethz.rosetta.versionExported
true
ethz.COinS
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