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Simultaneous imaging of the ferromagnetic and ferroelectric structure in multiferroic heterostructures
(2014)APL MaterialsBy measuring the spin polarization of secondary electrons and the intensity of backscattered electrons generated in a scanning electron microscope, we are able to simultaneously image the ferromagnetic domain structure of a ferromagnetic thin film and the ferroelectric domain structure of the underlying ferroelectric substrate upon which it is grown. Simultaneous imaging allows straightforward, quantitative measurements of the correlations ...Journal Article