Charge Detection in Gate-Defined Bilayer Graphene Quantum Dots

Kurzmann, Annika; Overweg, Hiske; Eich, Marius; Pally, Alessia; Rickhaus, Peter; Pisoni, Riccardo; Lee, Yongjin; Watanabe, Kenji; Taniguchi, Takashi; Ihn, Thomas M.; Ensslin, Klaus

doi:10.1021/acs.nanolett.9b01617

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Author

Date

2019-08-14

Type

Journal Article

Citations

Cited 48 times in Scopus

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yes

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Publication status

published

External links

https://doi.org/10.1021/acs.nanolett.9b01617

Journal / series

Nano Letters

Volume

19(8)

Pages / Article No.

5216 - 5221

Publisher

American Chemical Society

Subject

Bilayer graphene; quantum dot; charge detection; tunneling; multidots

Organisational unit

03439 - Ensslin, Klaus / Ensslin, Klaus
08835 - Ihn, Thomas (Tit.-Prof.)
02205 - FIRST-Lab / FIRST Center for Micro- and Nanoscience

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Citations

Cited 48 times in Scopus

ETH Bibliography

yes

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