Abstract
We present ultrafast x-ray diffraction (UXRD) experiments on different photoexcited oxide superlattices. All data are successfully simulated by dynamical x-ray diffraction calculations based on a microscopic model, that accounts for the linear response of phonons to the excitation laser pulse. Some Bragg reflections display a highly nonlinear strain dependence. The origin of linear and two distinct nonlinear response phenomena is discussed in a conceptually simpler model using the interference of envelope functions that describe the diffraction efficiency of the average constituent nanolayers. The combination of both models facilitates rapid and accurate simulations of UXRD experiments. Show more
Permanent link
https://doi.org/10.3929/ethz-b-000044826Publication status
publishedExternal links
Journal / series
New Journal of PhysicsVolume
Pages / Article No.
Publisher
IOP PublishingOrganisational unit
03920 - Johnson, Steven / Johnson, Steven
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