Abstract
We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry—in our instrument, the substrate is vibrating and the scanning tip is at rest. We present topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sensor and imaging tool. © 2021 American Physical Society Show more
Permanent link
https://doi.org/10.3929/ethz-b-000472073Publication status
publishedExternal links
Journal / series
Physical Review AppliedVolume
Pages / Article No.
Publisher
American Physical SocietyOrganisational unit
03906 - Degen, Christian / Degen, Christian
02205 - FIRST-Lab / FIRST Center for Micro- and Nanoscience
Funding
177198 - Zeptonewton force sensing on a membrane resonator platform (SNF)
309301 - Three-dimensional Magnetic Resonance Imaging at Molecular Resolution (EC)
ETH-03 16-1 - Attempt at the mechanical detection of a single nuclear spin (ETHZ)
Related publications and datasets
Is cited by: https://doi.org/10.3929/ethz-b-000482353
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