Experimental Analysis of Lag Sources in Pinned Photodiodes
dc.contributor.author
Bonjour, Lysandre-Edouard
dc.contributor.author
Blanc, Nicolas
dc.contributor.author
Kayal, Maher
dc.date.accessioned
2017-06-10T11:53:36Z
dc.date.available
2017-06-10T11:53:36Z
dc.date.issued
2012-12
dc.identifier.issn
0741-3106
dc.identifier.issn
1558-0563
dc.identifier.other
10.1109/LED.2012.2217474
dc.identifier.uri
http://hdl.handle.net/20.500.11850/59966
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Image lag
dc.subject
Photodiode lag
dc.subject
Potential barrier
dc.subject
Potential pocket
dc.subject
Spill-back
dc.subject
Transfer inefficiency
dc.subject
Traps
dc.title
Experimental Analysis of Lag Sources in Pinned Photodiodes
dc.type
Journal Article
ethz.journal.title
IEEE Electron Device Letters
ethz.journal.volume
33
ethz.journal.issue
12
ethz.journal.abbreviated
IEEE Electron Device Lett.
ethz.pages.start
1735
ethz.pages.end
1737
ethz.identifier.wos
ethz.identifier.nebis
000008013
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.date.deposited
2017-06-10T11:53:44Z
ethz.source
ECIT
ethz.identifier.importid
imp59365019c6e5e62654
ethz.ecitpid
pub:95935
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T12:22:52Z
ethz.rosetta.lastUpdated
2021-02-14T09:46:23Z
ethz.rosetta.versionExported
true
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Journal Article [128935]