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dc.contributor.author
Tagliavini, Giuseppe
dc.contributor.author
Marongiu, Andrea
dc.contributor.author
Rossi, Davide
dc.contributor.author
Benini, Luca
dc.date.accessioned
2023-10-17T08:39:43Z
dc.date.available
2023-10-17T08:36:44Z
dc.date.available
2023-10-17T08:39:43Z
dc.date.issued
2016
dc.identifier.isbn
978-1-5090-6113-6
en_US
dc.identifier.isbn
978-1-5090-6112-9
en_US
dc.identifier.isbn
978-1-5090-6114-3
en_US
dc.identifier.other
10.1109/ICECS.2016.7841261
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/637015
dc.description.abstract
Pushing supply voltages in the near-threshold region is today one of the main avenues to minimize power consumption in digital integrated circuits. This works well with logic units, but memory operations on standard six-transistor static RAM (6T-SRAM) cells become unreliable at low voltages. Standard cell memory (SCM) works fully reliably at near-threshold voltages, but has much lower area density than 6T-SRAM and thus it is too costly. Hybrid memory designs based on a combination of 6T-SRAM and SCM have the potential to combine the best from both worlds, provided that appropriate software techniques for their management are used. Several embedded applications exhibit inherent tolerance to data approximation: this feature can be exploited by mapping error-tolerant data onto unreliable 6T-SRAM while keeping critical information error-free in SCM. However, one key issue is bounding error when it is input-data dependent. In this work we consider the motion detection stage of a computer vision pipeline, which is a major power bottleneck in always-on computer vision systems. We introduce an application-level metric for defining suitable tolerance thresholds and an associated runtime mechanism for their control. At each accuracy checkpoint the error on the computation is checked. If the runtime detects that an error threshold has been exceeded, the voltage settings are adjusted. Using this methodology, we achieve a significant reduction of the total energy consumption (up to 33% in the best case) while maintaining a tight control on quality of results.
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
Always-On Motion Detection with Application-Level Mirror Control on a Near-Threshold Approximate Computing Platform
en_US
dc.type
Conference Paper
dc.date.published
2017-02-06
ethz.book.title
2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS)
en_US
ethz.pages.start
552
en_US
ethz.pages.end
555
en_US
ethz.event
23rd IEEE International Conference on Electronics, Circuits and Systems (ICECS 2016)
en_US
ethz.event.location
Monte Carlo, Monaco
en_US
ethz.event.date
December 11-14, 2016
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.date.deposited
2017-06-12T20:30:18Z
ethz.source
ECIT
ethz.identifier.importid
imp5936556d0f08f95429
ethz.identifier.importid
imp5936555c7b96350214
ethz.ecitpid
pub:193702
ethz.ecitpid
pub:192818
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2023-10-17T08:36:46Z
ethz.rosetta.lastUpdated
2024-02-03T05:19:18Z
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/164705
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/129829
ethz.COinS
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