Probing the Intrinsic Strain in Suspended Graphene Films using Electron and Optical Microscopy
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Date
2023-12-06Type
- Data Collection
ETH Bibliography
yes
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https://doi.org/10.3929/ethz-b-000646170Publisher
ETH ZurichOrganisational unit
03609 - Hierold, Christofer / Hierold, Christofer
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Is supplement to: https://doi.org/10.3929/ethz-b-000646233
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ETH Bibliography
yes
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