Elevated temperature, nano-mechanical testing in situ in the scanning electron microscope
- Journal Article
Journal / seriesReview of Scientific Instruments
Pages / Article No.
PublisherAmerican Institute of Physics
SubjectFocused ion beam technology; Micro-optics; Nanoidentation; Scanning electron microscopy; Strain sensors
NotesReceived 26 September 2012, Accepted 5 March 2013, Published online 3 April 2013.
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