Elevated temperature, nano-mechanical testing in situ in the scanning electron microscope
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Date
2013Type
- Journal Article
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
Review of Scientific InstrumentsVolume
Pages / Article No.
Publisher
American Institute of PhysicsSubject
Focused ion beam technology; Micro-optics; Nanoidentation; Scanning electron microscopy; Strain sensorsNotes
Received 26 September 2012, Accepted 5 March 2013, Published online 3 April 2013.More
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ETH Bibliography
yes
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