SCR operation mode of diode strings for ESD protection
dc.contributor.author
Glaser, Ulrich
dc.contributor.author
Esmark, Kai
dc.contributor.author
Streibl, Martin
dc.contributor.author
Russ, Christian
dc.contributor.author
Domanski, Krzysztof
dc.contributor.author
Ciappa, Mauro
dc.contributor.author
Fichtner, Wolfgang
dc.date.accessioned
2017-06-10T17:05:46Z
dc.date.available
2017-06-10T17:05:46Z
dc.date.issued
2007
dc.identifier.other
10.1016/j.microrel.2006.11.013
dc.identifier.uri
http://hdl.handle.net/20.500.11850/66958
dc.language.iso
en
dc.publisher
Pergamon
dc.title
SCR operation mode of diode strings for ESD protection
dc.type
Journal Article
ethz.journal.title
Microelectronics Reliability
ethz.journal.volume
47
ethz.journal.issue
7
ethz.pages.start
1044
ethz.pages.end
1053
ethz.identifier.wos
ethz.identifier.nebis
001933457
ethz.publication.place
Oxford
ethz.publication.status
published
ethz.leitzahl
03228 - Fichtner, Wolfgang
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03380 - Huang, Qiuting (emeritus) / Huang, Qiuting (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03380 - Huang, Qiuting (emeritus) / Huang, Qiuting (emeritus)
ethz.date.deposited
2017-06-10T17:07:35Z
ethz.source
ECIT
ethz.identifier.importid
imp5936509bca02892968
ethz.ecitpid
pub:106628
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T06:33:14Z
ethz.rosetta.lastUpdated
2020-02-14T12:02:11Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=SCR%20operation%20mode%20of%20diode%20strings%20for%20ESD%20protection&rft.jtitle=Microelectronics%20Reliability&rft.date=2007&rft.volume=47&rft.issue=7&rft.spage=1044&rft.epage=1053&rft.au=Glaser,%20Ulrich&Esmark,%20Kai&Streibl,%20Martin&Russ,%20Christian&Domanski,%20Krzysztof&rft.genre=article&rft_id=info:doi/10.1016/j.microrel.2006.11.013&
Files in this item
| Files | Size | Format | Open in viewer |
|---|---|---|---|
|
There are no files associated with this item. |
|||
Publication type
-
Journal Article [128916]