Excess carrier lifetimes in Ge layers on Si
dc.contributor.author
Geiger, R.
dc.contributor.author
Frigerio, J.
dc.contributor.author
Süess, M.J.
dc.contributor.author
Minamisawa, R.A.
dc.contributor.author
Chrastina, D.
dc.contributor.author
Isella, G.
dc.contributor.author
Spolenak, R.
dc.contributor.author
Faist, Jérôme
dc.contributor.author
Sigg, H.
dc.date.accessioned
2017-06-11T02:14:31Z
dc.date.available
2017-06-11T02:14:31Z
dc.date.issued
2013-12-31
dc.identifier.isbn
978-1-4673-5804-0
dc.identifier.other
10.1109/Group4.2013.6644447
dc.identifier.uri
http://hdl.handle.net/20.500.11850/77084
dc.language.iso
en
dc.publisher
IEEE
dc.title
Excess carrier lifetimes in Ge layers on Si
dc.type
Conference Paper
ethz.book.title
IEEE International Conference on Group IV Photonics GFP
ethz.pages.start
103
ethz.pages.end
104
ethz.event
10th International Conference on Group IV Photonics
ethz.event.location
Seoul, South Korea
ethz.event.date
August 28-30, 2013
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.date.deposited
2017-06-11T02:15:06Z
ethz.source
ECIT
ethz.identifier.importid
imp59365163516a393703
ethz.ecitpid
pub:121667
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T22:33:58Z
ethz.rosetta.lastUpdated
2024-02-01T21:18:43Z
ethz.rosetta.versionExported
true
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