An Efficient Real Time Fault Detection and Tolerance Framework Validated on the Intel SCC Processor
dc.contributor.author
Rai, Devendra
dc.contributor.author
Huang, Pengcheng
dc.contributor.author
Stoimenov, Nikolay
dc.contributor.author
Thiele, Lothar
dc.date.accessioned
2017-06-11T14:29:09Z
dc.date.available
2017-06-11T14:29:09Z
dc.date.issued
2014
dc.identifier.isbn
978-1-4503-2730-5
dc.identifier.other
10.1145/2593069.2593085
dc.identifier.uri
http://hdl.handle.net/20.500.11850/94138
dc.language.iso
en
dc.publisher
Association for Computing Machinery
dc.title
An Efficient Real Time Fault Detection and Tolerance Framework Validated on the Intel SCC Processor
dc.type
Conference Paper
ethz.book.title
Proceedings of the 51st Annual Design Automation Conference
ethz.pages.start
1
ethz.pages.end
6
ethz.event
51st Annual Design Automation Conference (DAC 2014)
ethz.event.location
San Francisco, CA, USA
ethz.event.date
June 7-11, 2015
ethz.identifier.wos
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02640 - Inst. f. Technische Informatik und Komm. / Computer Eng. and Networks Lab.::03429 - Thiele, Lothar (emeritus) / Thiele, Lothar (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02640 - Inst. f. Technische Informatik und Komm. / Computer Eng. and Networks Lab.::03429 - Thiele, Lothar (emeritus) / Thiele, Lothar (emeritus)
ethz.date.deposited
2017-06-11T14:29:25Z
ethz.source
ECIT
ethz.identifier.importid
imp593652a64f9a874840
ethz.ecitpid
pub:148000
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T02:36:09Z
ethz.rosetta.lastUpdated
2024-02-01T22:30:22Z
ethz.rosetta.versionExported
true
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