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dc.contributor.author
Wasmer, K.
dc.contributor.author
Wermelinger, T.
dc.contributor.author
Bidiville, A.
dc.contributor.author
Spolenak, R.
dc.contributor.author
Michler, J.
dc.date.accessioned
2017-06-08T20:06:34Z
dc.date.available
2017-06-08T20:06:34Z
dc.date.issued
2008
dc.identifier.issn
0884-2914
dc.identifier.issn
2044-5326
dc.identifier.other
10.1557/JMR.2008.0363
dc.identifier.uri
http://hdl.handle.net/20.500.11850/11008
dc.language.iso
en
dc.publisher
MRS
dc.title
In situ compression tests on micron-sized silicon pillars by Raman microscopy
dc.type
Journal Article
ethz.title.subtitle
Stress measurements and deformation analysis
ethz.journal.title
Journal of materials research
ethz.journal.volume
23
ethz.journal.issue
11
ethz.journal.abbreviated
J. mater. res.
ethz.pages.start
3040
ethz.pages.end
3047
ethz.notes
Received 16 May 2008, Accepted 8 August 2008.
ethz.identifier.nebis
000036584
ethz.publication.place
Warrendale, PA
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02160 - Departement Materialwissenschaft / Department of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02160 - Departement Materialwissenschaft / Department of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph
ethz.date.deposited
2017-06-08T20:06:38Z
ethz.source
ECIT
ethz.identifier.importid
imp59364bfbad7f916697
ethz.ecitpid
pub:22106
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T14:15:23Z
ethz.rosetta.lastUpdated
2018-08-02T04:39:23Z
ethz.rosetta.versionExported
true
ethz.COinS
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